NI PXIe‑6548 781012-03 32Ch 200MHz HSDIO Digital Waveform Instrument 400Mbps DDR

PXIe‑6548 | 200 MHz 32-Channel HSDIO Digital Waveform Generator/Analyzer

Core Hardware Specifications

• Channel Configuration: 32 single-ended bidirectional digital lines, hardware per-cycle direction control on 24 channels
• Timing Performance: Max 200 MHz base clock, double data rate up to 400 Mbps; 3 independent deskew banks with 150 ps fine timing resolution
• Logic Voltage: Programmable 1.2 V ~ 3.3 V with 100 mV step resolution, compatible with mainstream low-voltage digital chips
• Clock Source: Onboard DDS reference clock with sub-Hz frequency resolution, supports external clock input/output via front SMB
• Memory Options: 1 Mbit / 8 Mbit / 64 Mbit per module deep waveform storage for long sequence playback
• Core Test Function: Real-time hardware comparison on 24 channels for on-the-fly BER error capture without host intervention
• Data Streaming: Max 400 MB/s generation, 660 MB/s acquisition PCIe streaming bandwidth
• Synchronization: NI SMC core, PXI TClk star trigger, multi-module sub-nanosecond alignment
• Form Factor: Single hybrid PXIe slot, 32.2 W typical power draw, front DDC high-density connector

Core Functional Advantages

1. 200 MHz / 400 Mbps DDR high-speed digital channel covers high-speed parallel interface test of ADC, DAC, FPGA and automotive microcontrollers.
2. Three independent deskew timing banks finely calibrate clock-data skew, accurately characterize chip setup/hold timing margin.
3. Built-in real-time hardware comparison captures bit errors instantly, drastically improves mass-production semiconductor screening throughput.
4. Wide 1.2–3.3 V adjustable logic level adapts to diverse low-voltage chips without external level translation circuits.
5. Native PXI multi-instrument synchronization seamlessly combines with SMUs, digitizers and AWGs to build unified mixed-signal ATE platforms.

Software Compatibility

Typical Applications