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Home > Products > NI-PXIE > NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module

NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module

PXIe‑4163 (784483 series) single-slot 24-channel four-quadrant high-density PXIe SMU, ±24V/±50mA per channel, 10pA/100pA ultra-low current sensitivity, SourceAdapt load stabilization, 4-wire remote sense, 100kS/s sampling, niDCPower driver, for multi-site semiconductor parallel IV characterization & STS production test systems
 
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  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module
  • NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module,NI-Module,NI PXIe‑4163 784483-01 24Ch ±24V High Density 4-Quadrant PXIe SMU Module

Client Testimonials

Michael Anderson
Michael Anderson
Resort Developer, United States

A complete set of NI equipment that can operate completely, I am very grateful.

Sarah Chen
Sarah Chen
Hotel Chain Director, Singapore

I am satisfied that NIST calibration is possible

Emma Roberts
Emma Roberts
Hospitality Manager, UK

I really like this company for being able to deliver in a timely manner so that my laboratory can continue testing,

  • Description

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PXIe‑4163 | 24-Channel ±24 V High-Density Precision PXIe Source Measure Unit

PN series：784483-01(100pA) / 784483-02(10pA ultra-sensitive)
The PXIe‑4163 is single-slot high-channel-density PXIe SMU with 24 fully independent four-quadrant channels, designed for high-parallel multisite semiconductor production test and lab multi-device DC electrical characterization. It delivers 6× higher channel density than traditional single/4-channel PXI SMUs, perfectly matching NI Semiconductor Test System (STS) mass screening platformsNI.

Core Hardware Specifications

  • Channel Layout: 24 fully isolated independent four-quadrant SMU outputs in one single PXIe slot
  • Electrical Ratings: ±24 V voltage range; max ±50 mA per channel (high-power chassis), 1.2 W per channel sourcing/sinking power
  • Measurement Sensitivity: Two variants — 100 pA standard model & 10 pA ultra-low leakage model for photodiode & low-power chip testingNI
  • Key Tech: SourceAdapt dynamic transient response tuning eliminates overshoot/ringing on capacitive/inductive DUT loads
  • Signal Accuracy: Per-channel built-in 4-wire remote sense to cancel test fixture wiring resistance error
  • Sampling Performance: Up to 100 kS/s simultaneous voltage/current readback across all 24 channels
  • Timing Sync: Complete PXI star trigger bus, hardware sequencing engine for synchronized multi-channel IV sweep
  • Connector & Power: Front 62-pin DSUB terminal connector; requires auxiliary 48 V power supply for full rated output power
  • Operating Env: 0–55 ℃ operating temperature, compatible with all standard NI PXIe chassis with ≥58 W per-slot cooling

Core Functional Advantages

  1. Industry-leading 24 SMU channels per slot drastically reduces rack footprint, enabling up to 408 parallel SMU channels inside one 4U PXI chassis for multisite mass production testNI.
  2. Four-quadrant operation both sources and sinks DC power, covering diodes, MOSFETs, LEDs, image sensors, low-power MCU & analog IC IV curve measurement.
  3. SourceAdapt load matching technology suppresses voltage overshoot, protecting sensitive nano-scale semiconductors during fast voltage/current sweeping.
  4. Optional 10 pA ultra-high sensitivity accurately measures tiny leakage currents critical for low-power IoT, wearable and automotive chip reliability screening.
  5. Native PXI trigger synchronization seamlessly links with digital I/O, switching matrices & HSDIO instruments to build unified mixed-signal STS ATE workflow.

Software Compatibility

Supports Windows 10/11 64-bit, NI Linux Real-Time; fully compatible with LabVIEW, TestStand, DIAdem, niDCPower driver, InstrumentStudio soft panel; provides C/C++, Python, C# programming APIs.

Typical Applications

Multi-site semiconductor IC parallel IV parametric test, low-power microcontroller leakage current characterization, CMOS image sensor photodiode dark current measurement, LED & power discrete device reliability screening, automotive analog component bias durability test, lab multi-device simultaneous DC electrical validation.
1.Brand New Items: Comes with 3 Years Official Full Warranty

2. Used & Refurbished Items: Enjoy 2 Years Professional Warranty Service

3. Free Warranty Maintenance: All non‑human quality failures are covered for free repair and maintenance during the warranty period

4. Full Technical Support: Professional technical guidance and exclusive after‑sales repair services are provided for all warranty‑qualified products.

5.Strict Fault Verification: All product failures will be professionally inspected and confirmed to judge warranty eligibility accurately.

6. We strictly inspect damage reasons to confirm warranty eligibility.
• We ship out all orders within 3 business days after payment confirmed.

• Global fast shipping supported by FedEx and UPS Express Delivery.

• Real-time tracking number provided for every order, easy to track delivery status online.

• Every item will go through strict professional testing and full function inspection before shipment.

• We take detailed real photos for each product to confirm appearance, condition and accessories before delivery.

• Premium shockproof and anti-collision packaging to protect goods from damage during transit.

• Safe and smooth customs clearance, shorten delivery time.

• Complete accessories and intact packaging before shipping.

• Professional after-sales logistics support, we help solve all delivery and receiving problems.

• Fast global delivery, safe and reliable transportation guarantee.

PCIe S‑Series
PCIe S‑Series

PCIe S‑Series

NI S‑Series (61xx family) multifunction DAQ features true simultaneous‑sampling architecture with dedicated ADC per channel . Mostly PCI / PXI form‑factor, few native PCIe variants. It delivers near‑zero phase delay across channels, ideal for transient waveform capture, vibration, acoustic and other timing‑critical measurement tasks. Supported by NI‑DAQmx driver and compatible with LabVIEW, TestStand. Accessories are not interchangeable with X‑Series
PXIe X‑Series

PXIe X‑Series

NI PXIe X‑Series are high‑performance multifunction DAQ modules on PXIe bus. Built with STC3 timing engine, they integrate analog input, analog output, bidirectional DIO and four 32‑bit counter‑timers. Leverage PXIe high‑speed backplane for hardware triggering, retriggerable measurements and multi‑module synchronization with VHDCI‑68 connector. Fully compatible with NI‑DAQmx driver, supporting LabVIEW, TestStand, Python, C/C++ and C#. Widely applied for data acquisition, automated ATE and hardware‑in‑the‑loop test systems
NI‑9213 C‑Series Module

NI‑9213 C‑Series Module

NI‑9213 is a high‑density C‑Series thermocouple input module for CompactDAQ and CompactRIO systems. It offers 16‑channel, 24‑bit thermocouple measurement with up to 75 S/s per‑channel sampling rate. Integrated cold‑junction compensation, open‑thermocouple detection and anti‑aliasing filters. 250 Vrms channel‑to‑earth isolation with NIST‑traceable calibration, spring‑terminal connector supporting all standard thermocouple types. Mix‑and‑match with other C‑Series modules, widely used for multi‑channel temperature monitoring, environmental chamber and thermal‑cycle testing
PXIe‑1065 chassis

PXIe‑1065 chassis

PXIe‑1065 is NI high‑performance 18‑slot PXIe chassis, supporting mixed PXI and PXIe modules. It features 9 PXI slots, 4 hybrid slots, 3 PXIe peripheral slots and one PXIe system timing slotNI. High‑bandwidth backplane delivers low‑jitter 10 MHz /100 MHz reference clocks, supporting PXIe star trigger and multi‑module synchronization. Field‑replaceable modular power supply shuttle, temperature‑controlled variable‑speed fans, up to 30 W per‑slot cooling and rack‑mount capability. Widely deployed for multi‑channel ATE systems, hardware‑in‑the‑loop, signal acquisition and simulation test benches
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